Title | Surfactant-Mediated Epitaxy of Silicon-Germanium Films on Silicon (001) Substrates |
Author | *Tobias F. Wietler, Jan Schmidt, Dominic Tetzlaff, Eberhard Bugiel (Leibniz Univ. Hannover, Germany) |
Page | pp. 147 - 148 |
Title | Single-Crystalline SiGe Stripes on Insulating Substrate by Segregation-Free Rapid-Melting-Growth |
Author | *Ryo Matsumura, Ryusuke Kato, Yuki Tojo, Taizoh Sadoh, Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 149 - 150 |
Title | Ge-Diffusion-Controlled Gold-Induced Crystallization of (100)- or (111)-Oriented Ge for Flexible Electronics |
Author | *Jong-Hyeok Park (Kyushu Univ., JSPS Research Fellow, Japan), Tsuneharu Suzuki, Akira Ooato, Masanobu Miyao, Taizoh Sadoh (Kyushu Univ., Japan) |
Page | pp. 151 - 152 |
Title | Epitaxial Growth of B-Doped Si on Si(100) by ECR Ar Plasma CVD in a SiH4-B2H6-H2 Gas Mixture without Substrate Heating |
Author | Yusuke Abe, *Masao Sakuraba, Junichi Murota (Tohoku Univ., Japan) |
Page | pp. 153 - 154 |
Title | Effects of PDA Ambient on Leakage Current in Poly-Ge TFTs |
Author | *Shoichi Kabuyanagi, Tomonori Nishimura, Kosuke Nagashio, Akira Toriumi (Univ. of Tokyo/JST, CREST, Japan) |
Page | pp. 155 - 156 |
Title | Explosive Crystallization of Amorphous Germanium Films Induced by Atmospheric Pressure Micro-Thermal-Plasma-Jet Irradiation |
Author | *Takahiro Kamikura, Shohei Hayashi, Seiji Morisaki, Yuji Fujita, Muneki Akazawa, Seiichiro Higashi (Hiroshima Univ., Japan) |
Page | pp. 157 - 158 |
Title | Surface Modulation of Epitaxial Ge Layer in a Narrow Trench Array |
Author | *Byongju Kim, Hyunchul Jang, Sun-Wook Kim, Sangmo Koo, Dae-Hong Ko (Yonsei Univ., Republic of Korea) |
Page | pp. 159 - 160 |
Title | Epitaxial Growth of Si1-xGex Alloy on Si(100) by ECR Ar Plasma CVD in a SiH4-GeH4 Gas Mixture without Substrate Heating |
Author | *Naofumi Ueno, Masao Sakuraba, Junichi Murota, Shigeo Sato (Tohoku Univ., Japan) |
Page | pp. 161 - 162 |
Title | Structural Transition of Ge Growth on Si Induced by Submonolayer Carbon |
Author | *Yuhki Itoh, Shinji Hatakeyama, Takuya Matsuo, Katsuyoshi Washio (Tohoku Univ., Japan) |
Page | pp. 163 - 164 |
Title | Study of Interface Trap Density in a GeSn MOS Structure by Numerical Simulation of the Electrical Characteristics |
Author | *Bruno Baert (Univ. of Liege, Belgium), Somya Gupta (MTM Department, KU Leuven and IMEC, Belgium), Marcel Schmeits (Univ. of Liege, Belgium), Eddy Simoen (IMEC, Belgium), Ngoc Duy Nguyen (Univ. of Liege, Belgium) |
Page | pp. 165 - 166 |
Title | Effect of Boron Dopant of Si (001) Substrates on Growth of Ge Layers using Sputter Epitaxy Method |
Author | *Takahiro Tsukamoto (Tokyo Univ. of Agri. and Tech., Japan), Akifumi Kasamatsu, Nobumitsu Hirose, Takashi Mimura, Toshiaki Matsui (NICT, Japan), Yoshiyuki Suda (Tokyo Univ. of Agri. and Tech., Japan) |
Page | pp. 167 - 168 |
Title | Enhanced Au Induced Lateral Crystallization in Electron-Irradiated Amorphous Ge on SiO2 |
Author | *Shin Sakiyama, Takahiro Kaneko, Takanobu Ootsubo, Takatsugu Sakai, Kazutoshi Nakashima, Kenta Moto, Masashi Yoneoka, Kenichiro Takakura, Isao Tsunoda (Kumamoto National College of Tech., Japan) |
Page | pp. 169 - 170 |
Title | Surface Blistering of Germanium Co-Implanted with H and He Ions: Effects of Implantation Order |
Author | Jiayun Dai, *Zengfeng Di, Miao Zhang (Chinese Academy of Sciences, China) |
Page | pp. 171 - 172 |
Title | Large-Grained Oriented Polycrystalline Si/Al/SiO2 Structures Formed by Al-Induced Layer Exchange Process |
Author | *Ryohei Numata, Kaoru Toko (Univ. of Tsukuba, Japan), Noriyuki Saitoh, Noriko Yoshizawa (AIST, Japan), Noritaka Usami (Tohoku Univ., Japan), Takashi Suemasu (Univ. of Tsukuba, Japan) |
Page | pp. 173 - 174 |
Title | 3-Dimensionally-Graded SiGe-on-Insulator Stacked Structures by Successive Rapid-Melting Growth |
Author | Yuki Tojo, Ryo Matsumura, Hiroyuki Yokoyama, Masashi Kurosawa, Kaoru Toko, *Taizoh Sadoh, Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 175 - 176 |
Title | SiGe/Si Superlattice-Quantum-Dot Arrays Fabricated by using Nanosphere Lithography |
Author | Hung-Tai Chang, Bo-Lun Wu, Shao-Liang Cheng, *Sheng-Wei Lee (National Central Univ., Taiwan) |
Page | pp. 177 - 178 |
Title | N-type Doping of BaSi2 Epitaxial Films by Phosphorus Ion Implantation and Thermal Annealing |
Author | *Kosuke O. Hara (Nagoya Univ./JST, CREST, Japan), Yusuke Hoshi (Nagoya Univ., Japan), Noritaka Usami (Nagoya Univ./JST, CREST, Japan), Yasuhiro Shiraki (Tokyo City Univ., Japan), Kotaro Nakamura, Kaoru Toko (Univ. of Tsukuba, Japan), Takashi Suemasu (Univ. of Tsukuba/JST, CREST, Japan) |
Page | pp. 179 - 180 |
Title | Crystalline Structures and Electrical Property of Epitaxial Ni Germanide Layers Formed on Ge(110) Substrate |
Author | *Yunsheng Deng, Jun Yokoi, Osamu Nakatsuka, Noriyuki Taoka, Shigeaki Zaima (Nagoya Univ., Japan) |
Page | pp. 181 - 182 |
Title | Relationship between Stress Distribution and Hot-Carrier Effect for Strained nMOSFETs |
Author | *H.W. Hsu, H. S. Huang, S. Y. Chen (National Taipei Univ. of Tech., Taiwan), M. C. Wang (Minghsin Univ. of Science and Tech., Taiwan), K.C. Li (National Taipei Univ. of Tech., Taiwan), K. C. Lin (Ming Chuan Univ., Taiwan), C. H. Liu (National Taiwan Normal Univ., Taiwan) |
Page | pp. 183 - 184 |
Title | Radiation Tolerance of Si1-yCy Source/Drain n-MOSFETs with Different Carbon Concentrations |
Author | *Toshiyuki Nakashima (Univ. of Miyazaki/Chuo Denshi Kogyo Co. Ltd., Japan), Yuki Asai, Masato Hori, Masashi Yoneoka, Isao Tsunoda, Kenichiro Takakura (Kumamoto National College of Tech., Japan), Mireia Bargallo Gonzalez (Institut de Microelectronica de Barcelona, Spain), Eddy Simoen (IMEC, Belgium), Cor Claeys (IMEC/KU Leuven, Belgium), Kenji Yoshino (Univ. of Miyazaki, Japan) |
Page | pp. 185 - 186 |
Title | Extended Poly Gate Effect on the Performance of Strained PMOSFETs with a Narrow Channel Width |
Author | Chang-Chun Lee (Chung Yuan Christian Univ., Taiwan), Chuan-Hsi Liu (National Taiwan Normal Univ., Taiwan), Hung-Wen Hsu (National Taipei Univ. of Tech., Taiwan), Min-Hui Hung (National Taiwan Normal Univ., Taiwan), *Yin-Hao Lin (Chung Yuan Christian Univ., Taiwan) |
Page | pp. 187 - 188 |
Title | Analysis of Geometric Effects on Channel Stress Due to the Strained CESL and Spacer in MOSFET |
Author | *Ming-Jenq Twu (National Taiwan Normal Univ., Taiwan), Kuei-Chih Lin (Ming Chuan Univ., Taiwan), Chuan-Hsi Liu (National Taiwan Normal Univ., Taiwan) |
Page | pp. 189 - 190 |
Title | Strain Evolution in the Channel Region Induced by the Embedded Source and Drain with Graded Epitaxial Si1-xGex Layers |
Author | *Sangmo Koo, Sun-Wook Kim, Hyunchul Jang, Dae-Hong Ko (Yonsei Univ., Republic of Korea) |
Page | pp. 191 - 192 |
Title | Fabrication and Characteristic of Ultra-thin Strained SOI by He Implantation and Ion Cut Technique |
Author | Zhiqiang Mu, Zhongying Xue, Da Chen, *Miao Zhang, Zengfeng Di, Xi Wang (Chinese Academy of Sciences, China) |
Page | pp. 193 - 194 |
Title | Advanced Germanium Based CMOS with Strain Elements for pMOS and nMOS |
Author | *Matthias Bauer (ASM America Inc., U.S.A.) |
Page | pp. 195 - 196 |
Title | Tunnel Field-Effect Transistors with Germanium/Strained-Silicon Hetero-Junctions for Low Power Applications |
Author | *Minsoo Kim, Younghyun Kim, Masafumi Yokoyama, Ryosho Nakane, SangHyeon Kim, Mitsuru Takenaka, Shinichi Takagi (Univ. of Tokyo, Japan) |
Page | pp. 197 - 198 |
Title | Nitrogen Doping Effect upon Hole Tunneling Characteristics of Si Barriers in Si1-xGex/Si Resonant Tunneling Diode |
Author | *Tomoyuki Kawashima, Masao Sakuraba, Junichi Murota (Tohoku Univ., Japan) |
Page | pp. 199 - 200 |
Title | In-Depth Analysis of High-Quality Ge-on-Insulator Structure Formed by Rapid-Melting Growth |
Author | *Hironori Chikita, Ryo Matsumura, Yuki Tojo, Hiroyuki Yokoyama, Taizoh Sadoh, Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 201 - 202 |
Title | Laterally-Graded P-Doping in GOI Structure by Ion-Implantation and Rapid-Melting-Growth |
Author | *Ryo Matsumura, Mohammad Anisuzzaman, Taizoh Sadoh, Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 203 - 204 |
Title | The Influence of SiO2 Interfacial Layer Thickness on NBTI Degradation Mechanism of p Channel HfO2/AlN Gate MOSFETs |
Author | *Hanim Hussin (Univ. Teknologi MARA/Univ. of Malaya, Malaysia), Yasmin Abdul Wahab (Univ. of Malaya, Malaysia), Sharifah Shafini Syed Shahabuddin (Univ. of Malaya/Silterra (M) Sdn. Bhd., Malaysia), Norhayati Soin (Univ. of Malaya, Malaysia), Muhamad Faiz Bukhori (Univ. Kebangsaan Malaysia, Malaysia) |
Page | pp. 205 - 206 |
Title | Characterization of Electroluminescence from Multiply-Stacked B-doped Si Quantum Dots |
Author | *Takahisa Yamada, Katsunori Makihara, Hiroki Takami, Yoshihisa Suzuki (Nagoya Univ., Japan), Mitsuhisa Ikeda (Hiroshima Univ., Japan), Seiichi Miyazaki (Nagoya Univ., Japan) |
Page | pp. 207 - 208 |
Title | Highly N-doped, Tensile-strained Ge Grown on Si by Molecular Beam Epitaxy |
Author | *Keisuke Nishida, Xuejun Xu, Kentarou Sawano, Takuya Maruizumi, Yasuhiro Shiraki (Tokyo City Univ., Japan) |
Page | pp. 209 - 210 |
Title | Carrier Extraction from Ge Quantum Dots in Si Solar Cells |
Author | *Takeshi Tayagaki (Kyoto Univ./PRESTO-JST, Japan), Yusuke Hoshi (Tohoku Univ., Japan), Kazufumi Ooi (Kyoto Univ., Japan), Takanori Kiguchi, Noritaka Usami (Tohoku Univ., Japan) |
Page | pp. 211 - 212 |
Title | Evaluation of Propagation Loss of Si/SiGe/Si Photonic-Wire Waveguides for Si Based Optical Modulator |
Author | *Younghyun Kim (Univ. of Tokyo, Japan), Takenori Osada, Masahiko Hata (Sumitomo Chemical Co. Ltd., Japan), Mitsuru Takenaka, Shinichi Takagi (Univ. of Tokyo, Japan) |
Page | pp. 213 - 214 |
Title | Control of geometry in Si-Based Photonic Nanostructures Formed by Maskless Wet Etching Process and Its Impact on Optical Properties |
Author | *Yusuke Hoshi, Takanori Kiguchi (Tohoku Univ., Japan), Kazufumi Ooi, Takeshi Tayagaki (Kyoto Univ., Japan), Noritaka Usami (Tohoku Univ., Japan) |
Page | pp. 215 - 216 |
Title | Surface Plasmon Enhanced Light Emission from Silicon Nanocrystals |
Author | *Anis Boudraa (Tokyo Inst. of Tech., Japan), Ayse Seyhan (Tokyo Inst. of Tech./Nigde Univ., Turkey), Yoshifumi Nakamine, Yoshihiro Ogawa, Fujiro Minami, Yukio Kawano, Shunri Oda (Tokyo Inst. of Tech., Japan) |
Page | pp. 217 - 218 |
Title | Improvement of Photoluminescence from Ge Layer with Patterned Si3N4 Stressors |
Author | *Katsuya Oda (PETRA, PECST, Hitachi, Japan), Tadashi Okumura (Hitachi, Japan), Kazuki Tani, Shin-ichi Saito, Tatemi Ido (PETRA, PECST, Hitachi, Japan) |
Page | pp. 219 - 220 |
Title | Junctionless GeSn pMOSFETs on Si (111) by Solid Phase Epitaxy |
Author | *Tatsuro Maeda, Wipakorn Jevasuwan, Hiroyuki Hattori, Noriyuki Uchida (AIST, Japan), Jean-Pierre Locquet (KU Leuven, Belgium), Ruben Lieten (KU Leuven, IMEC, Belgium) |
Page | pp. 221 - 222 |
Title | Lateral Growth Enhancement of Poly-Ge1-xSnx on SiO2 using a Eutectic Reaction |
Author | *Masashi Kurosawa (Nagoya Univ., JSPS, Japan), Noriyuki Taoka, Mitsuo Sakashita, Osamu Nakatsuka (Nagoya Univ., Japan), Masanobu Miyao (Kyushu Univ., Japan), Shigeaki Zaima (Nagoya Univ., Japan) |
Page | pp. 223 - 224 |
Title | Ion Implantation-Induced Defects Generated in PN Junction Formation of Germanium |
Author | *Choong Hyun Lee, Tomonori Nishimura, Toshiyuki Tabata, Kosuke Nagashio, Akira Toriumi (Univ. of Tokyo, Japan) |
Page | pp. 225 - 226 |
Title | Melting-Induced-Mixing in a-Ge/Sn/c-Ge Structures for Sn-Doped Ge Films |
Author | *Yuki Kinoshita, Yuki Tojo, Ryo Matsumura, Taizoh Sadoh (Kyushu Univ., Japan), Tomoaki Nishimura (Hosei Univ., Japan), Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 227 - 228 |
Title | Tensile-Strained and n-Doped Ge Epilayers Grown on Si(001) by Molecular-Beam Epitaxy |
Author | *Kim Phuong Luong, Minh Tuan Dau (Aix-Marseille Univ., France), Abdelhamid Ghrib (Univ. of Paris-Sud, France), Mohammad Zrir, Matthieu Petit, Vinh Le Thanh (Aix-Marseille Univ., France), Moustafa El Kurdi, Philippe Boucaud (Univ. of Paris-Sud, France), Junichi Murota (Tohoku Univ., Japan) |
Page | pp. 229 - 230 |
Title | Low-Temperature Formation of SiGe Crystals by Partial-Melting Method in a-GeSn/Si(100) Structure |
Author | *Hironori Chikita, Ryo Matsumura, Yuki Tojo, Yuki Kinoshita, Taizoh Sadoh, Masanobu Miyao (Kyushu Univ., Japan) |
Page | pp. 231 - 232 |
Title | Low-Temperature Formation (~150oC) of Ge on Insulator through Layer-Exchange of Ge/Sn Stacked-Structures |
Author | *Akira Ooato, Tsuneharu Suzuki (Kyushu Univ., Japan), Jong-Hyeok Park (Kyushu Univ./JSPS Research Fellow, Japan), Masanobu Miyao, Taizoh Sadoh (Kyushu Univ., Japan) |
Page | pp. 233 - 234 |
Title | Study of Ge Loss during Ge Condensation Process |
Author | *Z.Y. Xue, Z.F. Di (Chinese Academy of Sciences, China), L. Ye (Lanzhou Univ., China), Z.Q. Mu (Chinese Academy of Sciences, China), D. Chen (Lanzhou Univ., China), X. Wei, M. Zhang, X. Wang (Chinese Academy of Sciences, China) |
Page | pp. 235 - 236 |
Title | Mechanical Property Effects of Si1-xGex Channel and Stressed CESL on Nano-Scaled nMOSFETs |
Author | C. C. Lee (Chung Yuan Christian Univ., Taiwan), C. H. Liu (National Taiwan Normal Univ., Taiwan), H. W. Hsu (National Taipei Univ. of Tech., Taiwan), Z. H. Chen, H. H. Teng (National Taiwan Normal Univ., Taiwan), *Y. J. Lai (Chung Yuan Christian Univ., Taiwan) |
Page | pp. 237 - 238 |
Title | Impact of Channel Width and Length on Mobility Enhancement of Strained Ge NMOSFET with SiGe Alloy Stressors |
Author | *C.-F. Lee, R.-Y He, S. T. Chang (National Chung Hsing Univ., Taiwan) |
Page | pp. 239 - 240 |
Title | Stability and Schottky Barrier of Spin-polarized Fe3Si/Ge Interfaces; First-Principles Study |
Author | *Kyosuke Kobinata, Takashi Nakayama (Chiba Univ., Japan) |
Page | pp. 241 - 242 |
Title | Magnetic Tunnel Junctions with an L21-Co2FeSi Electrode on Si Fabricated by Room-Temperature Molecular Beam Epitaxy |
Author | *Yuichi Fujita, Shinya Yamada, Yuya Maeda, Masanobu Miyao, Kohei Hamaya (Kyushu Univ., Japan) |
Page | pp. 243 - 244 |
Title | Improvement of Co2FeSi0.5Al0.5/Si Heterointerfaces for Spin Injectors in Silicon Spintronics |
Author | *Kohei Tanikawa, Soichiro Oki, Shinya Yamada, Makoto Kawano, Masanobu Miyao, Kohei Hamaya (Kyushu Univ., Japan) |
Page | pp. 245 - 246 |