Title | (Invited Paper) Growth and Exploitation of Strained Ge/(Si)GeSn Heterostructures for Optical, Electrical and Thermoelectric Applications |
Author | Stephan Wirths (Forschungszentrum Jülich GmbH, Germany), Stefan Stefanov (Univ. de Vigo, Spain), J.-H Fournier-Lupien (Ecole Polytechnique de Montreal, Canada), Zoran Ikonic (Univ. of Leeds, U.K.), Stefano Chiussi (Univ. of Vigo, Spain), Oussama Moutanabbir (Ecole Polytechnique de Montreal, Canada), A.T. Tiedemann, Patric Bernardy, Bernd Holländer, Gregor Mussler, Toma Stoica (Forschungszentrum Jülich GmbH, Germany), Jean-Michel Hartmann (CEA- LETI, France), Detlev Grützmacher, Siegfried Mantl, *Dan Buca (Forschungszentrum Jülich GmbH, Germany) |
Page | pp. 57 - 58 |
Title | EXAFS Study of Sn Local Environment in Strained and Relaxed CVD Grown Epitaxial GeSn Films |
Author | *Federica Gencarelli (IMEC, Belgium), Didier Grandjean (KU Leuven, Belgium), Yosuke Shimura, Benjamin Vincent (IMEC, Belgium), Andre' Vantomme (KU Leuven, Belgium), Wilfried Vandervorst, Roger Loo, Marc Heyns (IMEC, Belgium), Kristiaan Temst (KU Leuven, Belgium) |
Page | pp. 59 - 60 |
Title | Incorporation of a Vacancy with an Sn Atom in Epitaxial Ge1-xSnx Film Growth at Lower Temperature |
Author | *Eiji Kamiyama, Koji Sueoka (Okayama Prefectural Univ., Japan), Osamu Nakatsuka, Noriyuki Taoka, Shigeaki Zaima (Nagoya Univ., Japan), Koji Izunome, Kazuhiko Kashima (GlobalWafers Japan Corp. Ltd, Japan) |
Page | pp. 61 - 62 |
Title | Electrical Activity of Threading Dislocations and Defect Complexes in GeSn Epitaxial Layers |
Author | *Somya Gupta (IMEC/KU Leuven, Belgium), Eddy Simoen (IMEC, Belgium), Takanori Asano, Osamu Nakatsuka (Nagoya Univ., Japan), Federica Gencarelli (IMEC/KU Leuven, Belgium), Yosuke Shimura (IMEC/FWO Pegasus Marie Curie Fellow/KU Leuven, Belgium), Alain Moussa, Roger Loo (IMEC, Belgium), Shigeaki Zaima (Nagoya Univ., Japan), Bruno Baert, Adam Dobri, Ngoc Duy Nguyen (Univ. of Liege, Belgium), Marc Heyns (IMEC/KU Leuven, Belgium) |
Page | pp. 63 - 64 |
Title | Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx |
Author | *Yosuke Shimura, Wei Wang (IMEC, Belgium), Thomas Nieddu (Univ. of Liege, Belgium), Federica Gencarelli, Benjamin Vincent (IMEC, Belgium), Priya Laha, Herman Terryn (Vrije Univ.it Brussel, Belgium), Stefan Stefanov, Stefano Chiussi (Univ. de Vigo, Spain), Joris Van Campenhout (IMEC, Belgium), Ngoc Duy Nguyen (Univ. of Liege, Belgium), André Vantomme (KU Leuven, Belgium), Roger Loo (IMEC, Belgium) |
Page | pp. 65 - 66 |
Title | Formation and Characterization of Locally Strained Ge1-xSnx/Ge Microstructures |
Author | *Shinichi Ike (Nagoya Univ., Japan), Yoshihiko Moriyama (AIST, Japan), Masashi Kurosawa, Noriyuki Taoka, Osamu Nakatsuka (Nagoya Univ., Japan), Yasuhiko Imai, Shigeru Kimura (Japan Synchrotron Radiation Research Institute, Japan), Tsutomu Tezuka (AIST, Japan), Shigeaki Zaima (Nagoya Univ., Japan) |
Page | pp. 67 - 68 |